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CAD Models
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- CAD Model: CGH-S9-C9_A.step
- CAD Model: CGH-S9-C0_A.step
- CAD Model: CGH-S6-C6_A.step
- CAD Model: CGH-S6-C0_A.step
- CAD Model: CGH-S3-C6_A.step
- CAD Model: CGH-S3-C3_A.step
- CAD Model: CGH-S3-C0_A.step
- CAD Model: C6XXXC_A.step
- CAD Model: C4XXXC_A.step
- CAD Model: C3XXXs_A.step
- CAD Model: C2XXXS-BC.step 2-Inch Cylinder CGH
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Documentation
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- Customer Drawing: MP6-BLANK_A
- Customer Drawing: MP3-BLANK_A
- Customer Drawing: VRT-050_A
- Customer Drawing: CRT-050_A
- Customer Drawing: C6AC3_A
- Customer Drawing: C6R_A
- Customer Drawing: FP9-H600_A
- Customer Drawing: FP6-H600_B
- Customer Drawing: FP6-H425_B
- Customer Drawing: FP3-Z-H600_B
- Customer Drawing: FP3-Z-H425_B
- Customer Drawing: FP3-H600_A
- Customer Drawing: FP3-H425_A
- Customer Drawing: CGH-S9-C9_A
- Customer Drawing: CGH-S9-C0_A
- Customer Drawing: CGH-S6-C6_A
- Customer Drawing: CGH-S6-C0_A
- Customer Drawing: CGH-S3-C6_A
- Customer Drawing: CGH-S3-C3_A
- Customer Drawing: CGH-S3-C0_A
- Customer Drawing: C6XXXC_A
- Customer Drawing: C4XXXC_A
- Customer Drawing: C3XXXS_A
- Customer Drawing: C2XXXS-BC 2-Inch Cylinder CGH
- Customer Drawing: FP6-Z-H650_A
- Show Remaining Articles ( 10 ) Collapse Articles
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- About Morpheus and Installation
- 1. Preparing Metrology Measurements for Morpheus™
- 2. Loading Data into Morpheus™
- 3. Processing the Data in Morpheus™
- 4. Substrate Correction
- 5. Mapping Correction
- 6. Fitting and Removing Alignment Errors
- 7. Analyzing Uncertainty Stack-up
- 8. Generating a Report
- 9. Exporting Data
- 10. Reporting Feedback
- 11. Reporting a Bug
- Glossary
- About
- AOM Software License Agreement
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Publications
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- [2025] Metrology for efficient assembly, integration, and testing of space telescopes
- [2025] Rethinking alignment for systems that incorporate freeform optics
- [2025] Parametric relations for coupling wavefront measurements, mechanical misalignment, and operational performance for imaging systems
- [2025] Kinematic interfaces for freeform optics for efficient manufacture, test, and system assembly
- [2025] Applications of computer generated holograms for measuring X-ray and EUV optics
- [2023] New Applications of Computer Generated Holograms for Optical Testing
- [2023] Rapid surface metrology of freeform shapes using CGH interferometry
- [2022] Snapshot measurements with CGH interferometry to support volume production of freeform optics
- [2022] Computer generated hologram (CGH) education kit for hands-on learning of optical metrology for complex optics and systems
- [2022] CGH-assisted metrology testbed for the Thirty Meter Telescope primary mirror
- [2021] Metrology Testbed for the Thirty Meter Telescope Primary Mirror
- [2019] Interferometric Metrology for the TMT Primary Mirror Segments: Design and Analysis
- [2018] Infrared computer-generated holograms: design and application for the WFIRST grism using wavelength-tuning interferometry
- [2016] Optical Alignment with CGH Phase References
- [2014] Precision Alignment And Calibration Of Optical Systems Using Computer Generated Holograms
- [2014] Diffractive optics calibrator: measurement of etching variations for binary computer-generated holograms
- [2013] Optical testing with computer generated holograms: comprehensive error analysis
- [2013] Design and analysis of an alignment procedure using computer-generated holograms
- [2011] Low uncertainty alignment procedure using computer generated holograms
- [2010] Imaging issues for interferometry with CGH null correctors
- [2010] Measurement of aspheric mirror segments using Fizeau interferometry with CGH correction
- [2009] Fizeau interferometer with spherical reference and CGH correction for measuring large convex aspheres
- [2007] Fabrication error analysis and experimental demonstration for computer-generated holograms
- [2007] Optical alignment with computer-generated holograms
- [2007] Optimal design of computer-generated holograms to minimize sensitivity to fabrication errors
- [2007] Coupling of surface roughness to the performance of computer-generated holograms
- [2006] Analysis of phase sensitivity for binary computer-generated holograms
- [2006] Absolute calibration of null correctors using twin computer-generated holograms
- [2006] Use of computer generated holograms for alignment of complex null correctors
- [2005] Testing an off-axis parabola with a CGH and a spherical mirror as null lens
- [2004] Efficient testing of segmented aspherical mirrors by use of reference plate and computer-generated holograms. I. Theory and system optimization
- [2004] Efficient testing of segmented aspherical mirrors by use of a reference plate and computer-generated holograms. II. Case study, error analysis, and experimental validation
- [1999] Efficient testing of off-axis aspheres with test plates and computer-generated holograms
- [1999] Error analysis for CGH optical testing
- [1999] Diffraction wavefront analysis of computer-generated holograms
- [1995] Applications of computer-generated holograms for interferometric measurement of large aspheric optics
- Show Remaining Articles ( 21 ) Collapse Articles
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FAQs
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- What is a CGH (Computer-Generated Hologram)?
- How are CGHs used?
- What is a "null"?
- What is a "UUT"?
- How is a CGH mounted and adjusted?
- What types of surfaces can be measured using a CGH?
- What is the typical accuracy of a CGH?
- What are the benefits of using a CGH for metrology?
- What is CGH substrate error and how does it get subtracted?
- What are fiducial dots and how are they used?
- Are CGHs delicate?
- How do you clean a CGH?
- What is a Metrology Platform?
- What type of interferometer do I need to use a CGH?
- What is diffraction efficiency?
- What is the difference between an amplitude and a phase CGH?
- How is a CGH different from other types of holograms?
- What size CGHs does AOM produce?
- Do CGHs require regular calibration?
- How are CGHs made?
- Show Remaining Articles ( 5 ) Collapse Articles
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How-To's
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- What is a Datum?
- The Importance of UUT Alignment
- [VIDEO] Freeform CGH Metrology Demonstration: Step-by-Step Instructions
- [VIDEO] Metrology Platform for Easy and Precise Alignment in Freeform Optical Testing
- [VIDEO] Aligning a CGH Test
- [VIDEO] How to Measure a Cylinder Optic
- UUT Datum and Optical Coordinate Definitions
- CGH Test Alignment Correction with Morpheus
- [2026] Datum Based Metrology for Freeform Optics
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Technologies
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- Arc Focus Reference Alignment Patterns (AF)
- Crosshair Point Focus (PF-X)
- Line Focus Reference Alignment Patterns (LF)
- Confocal Point Focus Alignment Pattern (PF-C)
- Catseye Pair Alignment Pattern (CE-P)
- Catseye Single Alignment Pattern (CE-S)
- Collimation Alignment Pattern (CO)
- Visual Point Focus Alignment Pattern (PF-V)
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J. H. Burge, S. Ament, and C. K. Merle “Rethinking alignment for systems that incorporate freeform optics”, Proc. SPIE 13602, Optical System Alignment, Tolerancing, and Verification XVI, 1360209 (16 September 2025); https://doi.org/10.1117/12.3067016
Abstract:
The alignment of optical systems that incorporate components with freeform surfaces provides a particular challenge. Conventional methods that use axisymmetry are not adequate, and there are too many degrees of freedom to efficiently adjust for building production systems. The obvious solution is to make the systems and the components accurately with well-defined mating interfaces, so no adjustment is required. But in the absence of alignment feedback that references these datum features, the location of an optical surface is degenerate with its form — they have equivalent effects on the optical system. For example, a decenter of a spherical surface is equivalent with a shape change that looks like wedge in the surface. Freeform optics have complicated degeneracies for all degrees of freedom that require the part to be made with simultaneous control of the optical surface AND its location. Such parts can be manufactured using feedback from a measurement system that uses a metrology platform with mating interfaces that accurately match those for the assembly. Scanning systems can measure features on the metrology platform and tie them to the surface form. The use of interferometry with computer-generated holograms can make a snapshot measurement of both the surface form and the six degree of freedom location of the metrology platform.