Catseye Single Alignment Pattern (CE-S)

Name & ID	Symbol	Typical Target Used	DOF and Sensitivity	Description
Catseye Single (CE-S)		UUT Surface	Coarse (visual) to fine interferometric alignment of dZ	A single pattern is focused on the UUT optical surface. The central ray of this pattern must arrive normal to the UUT surface.

Catseye Single (CE-S) alignment patterns send a focused beam of light such that the central ray arrives normal to the reference target.

Power fringes of the CE-S pattern indicate dZ misalignment

Due to the required ray path, CE-S patterns targeting the UUT often obscure some of the Null pattern.

This pattern is recommended to use if:

• UUT is significantly oversized and Null pattern does not need to fill FA of UUT.
• Missing regions of UUT surface map can be tolerated from Null pattern or UUT can be clocked and combine multiple measurements together to capture full surface.

 

Click here for a summary table of all AOM alignment patterns.

IP Notice: Products and/or features listed on this page may be covered by one or more of the Patents and Patent Applications listed here.