Intellectual Property

Patents and IP Info

Virtual Patent Marking Notice by
Arizona Optical Metrology, LLC.

The following products and/or features are protected by patents in the U.S. and elsewhere for Arizona Optical Metrology, LLC. This website is provided to satisfy the virtual patent marking provisions of various jurisdictions including the virtual patent marking provisions of the America Invents Act and provide notice under 35 U.S.C. §287(a). The following list of products, features, and patents may not be all inclusive. For example, some products and/or features listed here may be covered by patents in the United States and elsewhere that are not listed, and other products and/or features not listed here may be protected by one or more patents in the United States and elsewhere. The following list of products and/or features may be covered by one or more of the following Patents and Patent Applications:

Product or Feature NamePatent TitlePatent Number(s)
Line Focus Reference Patterns (LF) and Related EmbodimentsAlignment of a measurement optical system and a sample under testU.S. Patent No. 11,774,236

PCT Published Application No. WO2022/170160
Metrology Platform (MP) and Related EmbodimentsSystems and methods for measurement of optical wavefrontsUS20210361159A1 (Patent Pending)
Arc Focus (AF), Crosshair Point Focus (PF-X), and Related EmbodimentsSystem and Method for Aligning an Object for Interferometric MeasurementUS 63/590,782 (Patent Pending)