Intellectual Property
Patents and IP Info
Virtual Patent Marking Notice by
Arizona Optical Metrology, LLC.
The following products and/or features are protected by patents in the U.S. and elsewhere for Arizona Optical Metrology, LLC. This website is provided to satisfy the virtual patent marking provisions of various jurisdictions including the virtual patent marking provisions of the America Invents Act and provide notice under 35 U.S.C. §287(a). The following list of products, features, and patents may not be all inclusive. For example, some products and/or features listed here may be covered by patents in the United States and elsewhere that are not listed, and other products and/or features not listed here may be protected by one or more patents in the United States and elsewhere. The following list of products and/or features may be covered by one or more of the following Patents and Patent Applications:
| Product or Feature Name | Patent Title | Patent Number(s) |
|---|---|---|
| Line Focus Reference Patterns (LF) and Related Embodiments | Alignment of a measurement optical system and a sample under test | U.S. Patent No. 11,774,236 European Patent EP4088084B1 |
| Metrology Platform (MP) and Related Embodiments | Systems and methods for measurement of optical wavefronts | U.S. Patent No. 12,053,240 B2 U.S. Patent No. 12,285,215 B2 |
| Telescope Alignment CGH | Hologram for Aiding Telescope Alignment | U.S. Patent Application #63/699,041 |
| Arc Focus (AF), Crosshair Point Focus (PF-X), and Related Embodiments | System and Method for Aligning an Object for Interferometric Measurement | PCT/US2024/051669 U.S. Patent Application #18/918,002 |