AOM will participate in the SPIE Astronomical Telescopes & Instrumentation program in Yokohama, Japan, this June.
Dr. Jim Burge will give a talk discussing AOM’s unique metrology capabilities for fast and easy surface figure error metrology of complex optical surfaces like freeforms and asphere, as well as novel methods for optical system alignment using computer-generated holograms (CGHs).
More details to come. Join us in Yokohama for a great show!