OPIE ’25 (OPTICS & PHOTONICS International Exhibition)
April 23 - April 25
Meet AOM at OPIE 2025 in Yokohama, Japan!
AOM – Arizona Optical Metrology will be attending the Optics & Photonics International Exhibition (OPIE) 2025 from April 23-25 in Yokohama, Japan. OPIE is a premier event for optics and photonics professionals in Asia, bringing together the latest innovations in the industry.
Our team will be on-site and available to connect. If you’d like to discuss AOM’s advanced CGH (Computer-generated hologram) solutions or our Morpheus CGH data processing software, reach out to set up a time to meet with Tyler Steele during the show.
We look forward to insightful discussions and catching up with colleagues in Yokohama! Let’s talk optics—see you there!