Join Us at OPIE 2025 in Yokohama, Japan!
AOM – Arizona Optical Metrology is proud to announce that we’ll be exhibiting at the Optics & Photonics International Exhibition (OPIE) 2025 from April 23-25 in Yokohama, Japan. As one of the key events for optics and photonics professionals in Asia, OPIE provides a platform to discover the latest innovations in the industry.
Visit our booth to see live demonstrations of our advanced CGH (Computer-Generated Hologram) systems and experience the power of Morpheus, our data reduction software for precise optical measurements. Whether you’re involved in optical manufacturing, R&D, or cutting-edge technologies, we’ll showcase how our metrology solutions can meet your needs.
Our team of experts, including Tyler Steele, will be available to discuss how AOM’s solutions can elevate your projects.
We look forward to meeting you in Yokohama and exploring the future of optics together!